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SSM6P09FU
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type
SSM6P09FU
High Speed Switching Applications
Unit: mm * * Small package Low Drain-Source ON resistance. : Ron = 2.7 (max) (@VGS = -10 V) : Ron = 4.2 (max) (@VGS = -4 V)
(Q1, Q2 Common)
Absolute Maximum Ratings (Ta = 25C)
Characteristics Drain-Source voltage Gate-Source voltage Drain current DC Pulse Symbol VDS VGSS ID IDP PD (Note 1) Tch Tstg Rating -30 20 -200 -800 300 150 -55~150 Unit V V mA mW C C
Drain power dissipation (Ta = 25C) Channel temperature Storage temperature range
JEDEC JEITA

Note:
Using continuously under heavy loads (e.g. the application of TOSHIBA 2-2J1C high temperature/current/voltage and the significant change in Weight: 6.8 mg (typ.) temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Note 1: Total rating, mounted on FR4 board 2 (25.4 mm x 25.4 mm x 1.6 t, Cu Pad: 0.32 mm x 6) Figure 1.
Handling Precaution
When handling individual devices (which are not yet mounting on a circuit board), be sure that the environment is protected against electrostatic electricity. Operators should wear anti-static clothing, and containers and other objects that come into direct contact with devices should be made of anti-static materials.
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SSM6P09FU
Marking Equivalent Circuit
(top view)
6
Figure 1: 25.4 mm x 25.4 mm x 1.6 t,
Cu Pad: 0.32 mm2 x 6
6
5
4
5
4 0.4 mm 0.8 mm 3 Test Condition VGS = 16 V, VDS = 0 ID = -1 mA, VGS = 0 VDS = -30 V, VGS = 0 VDS = -5 V, ID = -0.1 mA VDS = -5 V, ID = -100 mA (Note2) ID = -100 mA, VGS = -10 V (Note2) Min -30 -1.1 115 Typ. 2.1 3.3 4.0 22 5 14 85 85
DK
1 2 3 1
Q1 Q2
2
Electrical Characteristics (Ta = 25C) (Q1, Q2 common)
Characteristics Gate leakage current Drain-Source breakdown voltage Drain cut-off current Gate threshold voltage Forward transfer admittance Symbol IGSS V (BR) DSS IDSS Vth Yfs Max 1 -1 -1.8 2.7 4.2 6.0 pF pF pF ns Unit A V A V mS
Drain-Source ON resistance
RDS (ON)
ID = -100 mA, VGS = -4 V (Note2) ID = -100 mA, VGS = -3.3 V(Note2)
Input capacitance Reverse transfer capacitance Output capacitance Switching time Turn-on time Turn-off time
Ciss Crss Coss ton toff
VDS = -5 V, VGS = 0, f = 1 MHz VDS = -5 V, VGS = 0, f = 1 MHz VDS = -5 V, VGS = 0, f = 1 MHz VDD = -5 V, ID = -100 mA, VGS = 0~-4 V

Note2:
Pulse test
Switching Time Test Circuit (Q1, Q2 Common)
(a) Test circuit
0 -4 V 10 s VDD = -5 V Duty < 1% = VIN: tr, tf < 5 ns (Zout = 50 ) Common Source Ta = 25C OUT IN 50 RL VDD -4 V
(b) VIN
0V 10% 90% 90% 10% tr ton tf toff
(c) VOUT
VDS (ON)
VDD
Precaution
Vth can be expressed as voltage between gate and source when low operating current value is ID = -100 A for this product. For normal switching operation, VGS (on) requires higher voltage than Vth and VGS (off) requires lower voltage than Vth. (Relationship can be established as follows: VGS (off) < Vth < VGS (on) ) Please take this into consideration for using the device.
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(Q1, Q2 common)
ID - VDS
-500 Common Source Ta = 25C -400 -10 -4 7 8 Common Source Ta = 25C
RDS (ON) - ID
Drain-Source on resistance RDS (ON) ()
(mA)
6 5 4 -4 V 3 2 1 0 0 -10 V VGS = -3.3 V
-3.3 -300 -3.0 -200 -2.8 -2.6 -100 VGS = -2.4 V 0 0 -0.5 -1 -1.5 -2
Drain current ID
-100
-200
-300
-400
-500
Drain-Source voltage
VDS (V)
Drain current ID (mA)
ID - VGS
-1000 Common Source VDS = -5 V 7 -100 8
RDS (ON) - VGS
Common Source ID = -100 mA
Drain-Source on resistance RDS (ON) ()
(mA)
25C -10 Ta = 100C -1 -25C
6 5 Ta = 100C 4 3 2 1 25C
Drain current ID
-0.1
-25C
-0.01 0
-1
-2
-3
-4
0 0
-2
-4
-6
-8
-10
Gate-Source voltage
VGS (V)
Gate-Source voltage
VGS (V)
Yfs - ID RDS (ON) - Ta
8 Common Source 500 7 ID = -100 mA 1000 Common Source VDS = -5 V Ta = 25C
Forward transfer admittance Yfs (mS)
300
Drain-Source on resistance RDS (ON) ()
6 5 4 3 2 1 0 -25 VGS = -3.3 V -4 V -10 V
100
50 30
0
25
50
75
100
125
150
10 -10
-30
-50
-100
-300 -500
-1000
Ambient temperature Ta (C)
Drain current ID (mA)
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(Q1, Q2 common)
Vth - Ta
-2 -500 Common Source -1.8
IDR - VDS
Common Source VGS = 0 Ta = 25C D -300 G S -200 IDR
Drain Reveres current IDR (mA)
Vth (V)
ID = -0.1 mA VDS = -5 V
-1.6 -1.4 -1.2 -1 -0.8 -0.6 -0.4 -0.2 0 -25 0 25 50 75
-400
Gate threshold voltage
-100
100
125
150
0 0
0.2
0.4
0.6
0.8
1
1.2
1.4
Ambient temperature Ta (C)
Drain-Source voltage
VDS
(V)
C - VDS
500 Common Source VGS = 0 V f = 1 MHz Ta = 25C 5000
t - ID
Common Source VDD = -5 V VGS = 0~-4 V Ta = 25C
Switching time t (ns)
Capacitance C
(pF)
100
1000
toff tf 100 ton tr
Ciss 10 Coss
Crss 1 -0.1 10 -1
-1
-10
-100
-10
-100
-1000
Drain-Source voltage
VDS (V)
Drain current ID (mA)
PD* - Ta
400 Mounted on FR4 board. (25.4 mm x 25.4 mm x1.6 t 2 Cu pad: 0.32 mm x 6) Figure 1 300
Power dissipation PD* (mW)
200
100
0 0
20
40
60
80
100
120
140
160
Ambient temperature Ta (C)
*: Total rating
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RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN GENERAL
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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